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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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    Failures of nano-metric technologies owing to d...

    213,99 €
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  2. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

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    As technology scales into nano-meter region, de...

    160,49 €
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  3. Thermal and Power Management of Integrated Circuits

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    Thermal modeling of high performance circuits a...

    96,29 €
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  4. ESD Protection Device and Circuit Design for Advanced CMOS Technologies

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    The challenges associated with the design and i...

    171,19 €
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  5. Defect Oriented Testing for CMOS Analog and Digital Circuits

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    Defect oriented testing is expected to play a s...

    85,59 €
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  6. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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    Defect-oriented testing methods have come a lon...

    224,47 €
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  7. ESD Protection Device and Circuit Design for Advanced CMOS Technologies

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    ESD Protection Device and Circuit Design for Ad...

    191,59 €
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  8. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

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    CMOS SRAM Circuit Design and Parametric Test in...

    180,64 €
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  9. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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    Defect-oriented testing methods have come a lon...

    208,03 €
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  10. Thermal and Power Management of Integrated Circuits

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    In Thermal and Power Management of Integrated C...

    147,76 €
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  11. Esd Protection Device and Circuit Design for Advanced CMOS Technologies

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    Besorgungstitel - wird vorgemerkt

    The challenges associated with the design and i...

    180,64 €
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  12. CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

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    Besorgungstitel - wird vorgemerkt

    As technology scales into nano-meter region, de...

    169,68 €
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